发明授权
- 专利标题: Apparatus for detecting the change of light intensity
- 专利标题(中): 用于检测光强度变化的装置
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申请号: US617615申请日: 1990-11-26
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公开(公告)号: US5153667A公开(公告)日: 1992-10-06
- 发明人: Shinichiro Aoshima , Hironori Takahashi , Yutaka Tsuchiya
- 申请人: Shinichiro Aoshima , Hironori Takahashi , Yutaka Tsuchiya
- 申请人地址: JPX Shizuoka
- 专利权人: Hamamatsu Photonics K. K.
- 当前专利权人: Hamamatsu Photonics K. K.
- 当前专利权人地址: JPX Shizuoka
- 优先权: JPX1-311249 19891130
- 主分类号: G01J1/44
- IPC分类号: G01J1/44 ; G01R1/07 ; G01R13/34 ; G01R15/24 ; G01R19/00
摘要:
A light beam is chopped and split into two beams. Intensity of a first beam is changed by using, e.g., an electrooptic material in accordance of a change in a signal to be detected, such as a voltage in an electronic device, and detected by a first photodetector. On the other hand, a second beam is detected by a second photodetector without being subjected to the intensity change. At least one of the outputs of the first and second photodetectors are adjusted so that they become equal to each other when no signal is applied to the light intensity changing means. The difference of the thus adjusted output signals is detected by, e.g., a lock-in amplifier in a narrow band at the chopping frequency.
公开/授权文献
- US5790294A Line monitoring method and line monitoring apparatus 公开/授权日:1998-08-04
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