发明授权
- 专利标题: Ion-scattering spectrometer
- 专利标题(中): 离子散射光谱仪
-
申请号: US795144申请日: 1991-11-20
-
公开(公告)号: US5166521A公开(公告)日: 1992-11-24
- 发明人: Shigeki Hayashi , Sumio Kumashiro , Masakazu Aono , Mitsuhiro Katayama
- 申请人: Shigeki Hayashi , Sumio Kumashiro , Masakazu Aono , Mitsuhiro Katayama
- 申请人地址: JPX Kyoto JPX Saitama
- 专利权人: Shimadzu Corporation,Rikagaku Kenkyuusyo
- 当前专利权人: Shimadzu Corporation,Rikagaku Kenkyuusyo
- 当前专利权人地址: JPX Kyoto JPX Saitama
- 优先权: JPX2-338661 19901130
- 主分类号: G01N27/62
- IPC分类号: G01N27/62 ; G01Q60/44 ; H01J37/252 ; H01J49/40
摘要:
An ion source, a first control electrode for controlling an ion beam emitted by the ion source, a detector for detecting scattered particles, and a second control electrode for controlling the ion beam, which is directed from the ion source toward a sample, as well as the scattered particles, are arranged on the same axis along with the sample. The ion beam directed from the ion source toward the sample, and the scattered particles, which are scattered from the sample and are directed toward the detector, are caused to converge. By using an Einzel-type lens as the second control electrode, charged particles and neutral particles constituting the scattered particles are provided with a difference in speed. The detector possesses an anode plate which is divided into the form of concentric, circular plates or concentric arc-shaped plates, and each divided anode plate provides a detection output which contains information relating to a distribution of the scattering angles of the scattered ions.
公开/授权文献
- US5823486A Universal flexible arm 公开/授权日:1998-10-20
信息查询