发明授权
US5166742A Optical deformation measuring apparatus by double-writing speckle images
into a spatial light modulator
失效
光学变形测量装置通过将散斑图像双重写入空间光调制器
- 专利标题: Optical deformation measuring apparatus by double-writing speckle images into a spatial light modulator
- 专利标题(中): 光学变形测量装置通过将散斑图像双重写入空间光调制器
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申请号: US748884申请日: 1991-08-23
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公开(公告)号: US5166742A公开(公告)日: 1992-11-24
- 发明人: Yuji Kobayashi , Tamiki Takemori , Tsutomu Hara , Naohisa Mukohzaka , Narihiro Yoshida
- 申请人: Yuji Kobayashi , Tamiki Takemori , Tsutomu Hara , Naohisa Mukohzaka , Narihiro Yoshida
- 申请人地址: JPX Shizuoka
- 专利权人: Hamamatsu Photonics K.K.
- 当前专利权人: Hamamatsu Photonics K.K.
- 当前专利权人地址: JPX Shizuoka
- 优先权: JPX2-339854 19901130
- 主分类号: G01B9/02
- IPC分类号: G01B9/02 ; G01B11/16 ; G02F1/135
摘要:
An object is typically illuminated by laser light, and reflected light carrying a speckle pattern is amplified by an image intensifier. First and second speckle patterns representing the object before and after its deformation, respectively are written by double writing into a ferroelectric liquid crystal spatial light modulator (FLC-SLM). The double-written image is read out from the FLC-SLM, and converted by a Fourier transform optical system into an output optical image, i.e., Young's fringe. The output optical image is detected by a photoelectric converter, and analyzed by an image processing device to determine a deformation of the object.
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