发明授权
- 专利标题: Optical waveform measuring device
- 专利标题(中): 光学波形测量装置
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申请号: US858861申请日: 1992-03-27
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公开(公告)号: US5168164A公开(公告)日: 1992-12-01
- 发明人: Tsuneyuki Urakami , Motohiro Suyama
- 申请人: Tsuneyuki Urakami , Motohiro Suyama
- 申请人地址: JPX Hamamatsu
- 专利权人: Hamamatsu Photonics K.K.
- 当前专利权人: Hamamatsu Photonics K.K.
- 当前专利权人地址: JPX Hamamatsu
- 优先权: JPX3-63433 19910327
- 主分类号: G01J11/00
- IPC分类号: G01J11/00
摘要:
When sampling light and light to be measured each having a wavelength longer than an upper wavelength limit of the sensitivity of a photocathode are incident on the photocathode of a multiphoton absorption-type electron tube, light-light sampling is enabled by two-photon absorption and one-photoelectron emission. A delaying unit adjusts an incident timing of the sampling light from an optical pulse generating unit on the elctron tube in synchronism with an incident timing of the light to be measured on the electron tube. A half mirror causes the sampling light and the light to be measured to coincide on the photocathode of the electron tube. A controlling unit controls the delaying unit to sequentially shift the incident timing of the sampling light on the electron tube. Thus, the operation of a display unit can be controlled in synchronism with the incident timing of the sampling light so that a series of sampling outputs from the electron tube can be converted to the optical waveform of the light to be measured and displayed on the display unit.
公开/授权文献
- US5955760A Transistor device structures 公开/授权日:1999-09-21
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