发明授权
US5168499A Fault detection and bypass in a sequence information signal processor
失效
序列信息信号处理器中的故障检测和旁路
- 专利标题: Fault detection and bypass in a sequence information signal processor
- 专利标题(中): 序列信息信号处理器中的故障检测和旁路
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申请号: US591990申请日: 1990-10-02
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公开(公告)号: US5168499A公开(公告)日: 1992-12-01
- 发明人: John C. Peterson , Edward T. Chow
- 申请人: John C. Peterson , Edward T. Chow
- 申请人地址: CA Pasadena
- 专利权人: California Institute of Technology
- 当前专利权人: California Institute of Technology
- 当前专利权人地址: CA Pasadena
- 主分类号: G06F7/02
- IPC分类号: G06F7/02 ; G06F11/00 ; G06F11/267 ; G06F17/10 ; G06F19/00
摘要:
The invention comprises a plurality of scan registers, each such register respectively associated with a processor element; an on-chip comparator, encoder and fault bypass register. Each scan register generates a unitary signal the logic state of which depends on the correctness of the input from the previous processor in the systolic array. These unitary signals are input to a common comparator which generates an output indicating whether or not an error has occurred. These unitary signals are also input to an encoder which identifies the location of any fault detected so that an appropriate multiplexer can be switched to bypass the faulty processor element. Input scan data can be readily programmed to fully exercise all of the processor elements so that no fault can remain undetected.