发明授权
US5181094A Complementary semiconductor device having improved device isolating
region
失效
具有改进的器件隔离区域的互补半导体器件
- 专利标题: Complementary semiconductor device having improved device isolating region
- 专利标题(中): 具有改进的器件隔离区域的互补半导体器件
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申请号: US783029申请日: 1991-10-25
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公开(公告)号: US5181094A公开(公告)日: 1993-01-19
- 发明人: Takahisa Eimori , Wataru Wakamiya , Hiroji Ozaki , Yoshinori Tanaka , Shinichi Satoh
- 申请人: Takahisa Eimori , Wataru Wakamiya , Hiroji Ozaki , Yoshinori Tanaka , Shinichi Satoh
- 申请人地址: JPX Tokyo
- 专利权人: Mitsubishi Denki Kabushiki Kaisha
- 当前专利权人: Mitsubishi Denki Kabushiki Kaisha
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX63-247673 19880929
- 主分类号: H01L27/092
- IPC分类号: H01L27/092
摘要:
A complementary semiconductor device having an improved capability of isolating devices comprises a P well 3 and an N well 2 both formed adjacent to each other on a main surface of a substrate 1, an N type impurity layer formed in the P well 8 on the main surface of the substrate, a P type impurity layer formed in the N well 9 on the main surface of the substrate, an N type region formed at the junction of the N well and the P well 71 on the main surface of the substrate, a first shield electrode 52 formed between the N type impurity layer 8 and the N type region 71 on the main surface of the substrate through an insulating film and a second shield electrode 51 formed between the N type region 71 and the P type impurity layer 9 on the main surface of the substrate through an insulating film. The first shield electrode 52 is connected to a potential V.sub.SS and the second shield electrode 51 and the N type region 71 are connected to a potential V.sub.CC, so that an N channel MOS transistor 101 comprising the first shield electrode 52 does not turn on and a device comprising the second shield electrode does not form a field effect transistor.
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