Invention Grant
- Patent Title: Instrument for measuring thickness of coated plate and method thereof
- Patent Title (中): 涂布板厚度测量仪及其方法
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Application No.: US586889Application Date: 1990-09-24
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Publication No.: US5201225APublication Date: 1993-04-13
- Inventor: Osamu Takahashi , Masaaki Nakata
- Applicant: Osamu Takahashi , Masaaki Nakata
- Applicant Address: JPX Tokyo
- Assignee: Toyo Kanetsu K.K.
- Current Assignee: Toyo Kanetsu K.K.
- Current Assignee Address: JPX Tokyo
- Main IPC: G01B17/02
- IPC: G01B17/02
Abstract:
One oscillator of a dual type ultrasonic probe generates an ultrasonic pulse and receives a surface reflection wave and a boundary face reflection wave from a coated plate. Another oscillator receives a bottom reflection wave from the coated plate. As a result, these reflection waves can be received at high levels, and reception times of the boundary face reflection wave and the bottom reflection wave can be accurately discriminated. Therefore, the thickness of the plate alone can be accurately calculated from the difference in reception times.
Public/Granted literature
- US4759287A Unit-to-unit register adjusting apparatus for use in a sheet-fed rotary printing press Public/Granted day:1988-07-26
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