发明授权
- 专利标题: Emissivity independent temperature measurement systems
- 专利标题(中): 发射率独立温度测量系统
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申请号: US876722申请日: 1992-04-17
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公开(公告)号: US5226732A公开(公告)日: 1993-07-13
- 发明人: James S. Nakos , Paul E. Bakeman, Jr. , Dale P. Hallock , Jerome B. Lasky , Scott L. Pennington
- 申请人: James S. Nakos , Paul E. Bakeman, Jr. , Dale P. Hallock , Jerome B. Lasky , Scott L. Pennington
- 申请人地址: NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: NY Armonk
- 主分类号: G01J5/00
- IPC分类号: G01J5/00
摘要:
An improved contactless temperature measurement system is provided which includes a workpiece, a chamber containing the workpiece with the walls thereof being substantially transmissive to radiation at wavelengths other than a given wavelength and substantially reflective at the given wavelength to remove the dependence of the apparent or measured temperature on the workpiece emissivity variations or fluctuations.
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