发明授权
- 专利标题: Compact high density interconnect structure
- 专利标题(中): 紧密的高密度互连结构
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申请号: US548462申请日: 1990-07-02
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公开(公告)号: US5241456A公开(公告)日: 1993-08-31
- 发明人: Walter M. Marcinkiewicz , Charles W. Eichelberger , Robert J. Wojnarowski
- 申请人: Walter M. Marcinkiewicz , Charles W. Eichelberger , Robert J. Wojnarowski
- 申请人地址: NY Schenectady
- 专利权人: General Electric Company
- 当前专利权人: General Electric Company
- 当前专利权人地址: NY Schenectady
- 主分类号: H01L23/52
- IPC分类号: H01L23/52 ; H01L23/538 ; H01L25/00
摘要:
An improved high density interconnect structure may include electronic components mounted on both sides of its substrate or a substrate which is only as thick as the semiconductor chips which reduces the overall structure thickness to the thickness of the semiconductor chips plus the combined thickness of the high density interconnect structure's dielectric and conductive layers. In the two-sided structures, feedthroughs, which are preferably hermetic, provide connections between opposite sides of the substrate. Substrates of either of these types may be stacked to form a three-dimensional structure. Means for connecting between adjacent substrates are preferably incorporated within the boundaries of the stack rather than on the outside surface thereof.
公开/授权文献
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