发明授权
US5262722A Apparatus for near surface nondestructive eddy current scanning of a
conductive part using a multi-layer eddy current probe array
失效
使用多层涡流探针阵列对导电部件进行近表面非破坏性涡流扫描的装置
- 专利标题： Apparatus for near surface nondestructive eddy current scanning of a conductive part using a multi-layer eddy current probe array
- 专利标题（中）： 使用多层涡流探针阵列对导电部件进行近表面非破坏性涡流扫描的装置
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申请号： US862699申请日： 1992-04-03
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公开(公告)号： US5262722A公开(公告)日： 1993-11-16
- 发明人: Kristina H. V. Hedengren , Richard J. Charles , William P. Kornrumpf
- 申请人： Kristina H. V. Hedengren , Richard J. Charles , William P. Kornrumpf
- 申请人地址： NY Schenectady
- 专利权人： General Electric Company
- 当前专利权人： General Electric Company
- 当前专利权人地址： NY Schenectady
- 主分类号： G01N27/90
- IPC分类号： G01N27/90 ; G01R33/12
摘要：
An apparatus for near surface, nondestructive eddy current scanning of a conductive part using a multi-layer eddy current probe array. Such structures of this type, generally, employ an ultra-thin, flexible, film-like, multi-layer eddy current probe array which is adapted to provide routine inspection of conductive parts while also providing improved signal integrity, signal transmission and isolation.
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