发明授权
- 专利标题: Substantially facet-free selective epitaxial growth process
- 专利标题(中): 大面积无选择性外延生长工艺
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申请号: US935840申请日: 1992-08-26
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公开(公告)号: US5273621A公开(公告)日: 1993-12-28
- 发明人: Anatoly Feygenson , John W. Osenbach , Donald G. Schimmel
- 申请人: Anatoly Feygenson , John W. Osenbach , Donald G. Schimmel
- 申请人地址: NJ Murray Hill
- 专利权人: AT&T Bell Laboratories
- 当前专利权人: AT&T Bell Laboratories
- 当前专利权人地址: NJ Murray Hill
- 主分类号: H01L21/20
- IPC分类号: H01L21/20 ; H01L21/00
摘要:
A process for growing selective epitaxial layers on a silicon substrate. In a epitaxial growth reactor, hydrogen and the reactive gasses, the silicon source gas and hydrochloric acid, are introduced. The amount of silicon to free hydrochloric acid is controlled to be about 1:6 during the growth process and then turned off, the hydrogen remaining on. The resulting epitaxial layer may be grown over one micron in thickness with less than 0.1 micron of faceting. Further, a etchant of H.sub.2 O and HF diluted in NHO.sub.3 is first used to remove surface damage on the silicon substrate prior to epitaxial layer growth.
公开/授权文献
- US5921173A Bakeware with patterned surface texture 公开/授权日:1999-07-13
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