发明授权
- 专利标题： Multi-element simultaneous analysis atomic absorption spectroscopy photometer and multi-element simultaneous analytic method
- 专利标题（中）： 多元素同时分析原子吸收光谱光度计和多元素同时分析法
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申请号： US597324申请日： 1990-10-15
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公开(公告)号： US5283624A公开(公告)日： 1994-02-01
- 发明人: Masamichi Tsukada , Konosuke Oishi
- 申请人： Masamichi Tsukada , Konosuke Oishi
- 申请人地址： JPX Tokyo
- 专利权人： Hitachi, Ltd.
- 当前专利权人： Hitachi, Ltd.
- 当前专利权人地址： JPX Tokyo
- 优先权： JPX1-268947 19891018
- 主分类号： G01J3/04
- IPC分类号： G01J3/04 ; G01J3/10 ; G01J3/12 ; G01J3/18 ; G01J3/36 ; G01N21/31 ; G01N21/74 ; G01J3/42 ; G01J3/28
摘要：
Incident slits and exit slits are provided separately on corresponding optical axes incident simultaneously on a spectroscope from a sample atomizing unit. A mechanism for changing the widths of the respective incident slits and exiting slits is provided such that the slit widths optimal to the respective elements to be measured are set on the corresponding optical axes to thereby realize high sensitivity analysis of all the elements to be measured simultaneously.
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