发明授权
- 专利标题： Electromagnetic field analyzer for devices in which an electromagnetic field is present near a conductor and an electric charge moves in the electromagnetic field, and method of analyzing an electromagnetic field
- 专利标题（中）： 电磁场分析仪，用于在导体附近存在电磁场和电荷在电磁场中移动的装置，以及分析电磁场的方法
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申请号： US699513申请日： 1991-05-14
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公开(公告)号： US5315233A公开(公告)日： 1994-05-24
- 发明人: Kazuyuki Sakiyama , Akira Ahagon , Hidetoshi Kotera , Hiromi Kita
- 申请人： Kazuyuki Sakiyama , Akira Ahagon , Hidetoshi Kotera , Hiromi Kita
- 申请人地址： JPX Osaka
- 专利权人： Matsushita Electric Industrial Co., Ltd.
- 当前专利权人： Matsushita Electric Industrial Co., Ltd.
- 当前专利权人地址： JPX Osaka
- 优先权： JPX2-127365 19900516
- 主分类号： G01R33/00
- IPC分类号： G01R33/00 ; G01R29/08 ; G01R33/10 ; G06F17/50 ; G06J1/02 ; G21K1/00 ; G01R33/02 ; H01J25/00
摘要：
In order to take into account the effect of load resistance applied to an electromagnetic field in analyzing an electromagnetic wave oscillator, the present invention arranges a resistance equivalent to the load resistance in the analytical region, and converts a voltage applied to the load and the current flowing therein into an electric field component and a magnetic field component to analyze the electromagnetic field distribution of the entire analytical region. The motion of an electrical charge is thus analyzed taking into account a force applied to the electric charge by the electromagnetic field distribution. This compound analysis of both the electric charge motion and the electromagnetic field is alternately and repeatedly performed.
公开/授权文献
- US5815227A Backlight for liquid crystal display 公开/授权日：1998-09-29
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