发明授权
- 专利标题: Differential CMOS peak detection circuit
- 专利标题(中): 差分CMOS峰值检测电路
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申请号: US32032申请日: 1993-03-16
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公开(公告)号: US5331210A公开(公告)日: 1994-07-19
- 发明人: Benjamin J. McCarroll
- 申请人: Benjamin J. McCarroll
- 申请人地址: OR Wilsonville
- 专利权人: Tektronix, Inc.
- 当前专利权人: Tektronix, Inc.
- 当前专利权人地址: OR Wilsonville
- 主分类号: G01R19/04
- IPC分类号: G01R19/04 ; G11C27/00 ; H03K5/1532 ; H03K5/24
摘要:
A fully differential CMOS peak detection circuit has a differential input stage and a negative feedback loop that form a differential unity gain feedback amplifier. The differential output of the differential input stage is applied to a differential peak detect circuit having a pair of series diode/capacitor combinations. The diode/capacitor junctions are applied to differential inputs of the negative feedback loop. A common mode correction circuit is coupled to the differential CMOS peak detection circuit to minimize differences between the common mode voltages of the differential input stage and the negative feedback loop. The differential peak voltage is held at the differential output of the differential input stage for sampling by a sampling circuit during a readback interval, and then tracks a differential input signal applied to the differential input of the differential input stage during a tracking interval. The differential peak detection circuit then peak detects during a peak detect interval that is equal to a desired sample time window.
公开/授权文献
- US5906145A Roofing shovel 公开/授权日:1999-05-25
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