发明授权
- 专利标题: Surface particle detection using heterodyne interferometer
- 专利标题(中): 使用外差干涉仪进行表面粒子检测
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申请号: US897198申请日: 1992-06-11
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公开(公告)号: US5343290A公开(公告)日: 1994-08-30
- 发明人: John S. Batchelder , Donald M. DeCain , Philip C. D. Hobbs , Marc A. Taubenblatt
- 申请人: John S. Batchelder , Donald M. DeCain , Philip C. D. Hobbs , Marc A. Taubenblatt
- 申请人地址: NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: NY Armonk
- 主分类号: G01B9/02
- IPC分类号: G01B9/02 ; G01B11/30 ; G01J9/04 ; G01N21/47 ; G01N21/88 ; G01N21/93 ; G01N21/94 ; G01N21/95 ; G01N21/956 ; H01L21/66
摘要:
A heterodyne interferometer is combined with darkfield surface particle detection for improved surface particle detection sensitivity. The probe beam and the reference beam have different wavelengths. The reference beam may either be a real reference beam or a virtual reference beam. The probe beam may be incident at the surface at either a grazing angle or at an angle substantially normal to the surface. The real reference beam is incident at the surface at a grazing angle. The detection may either be conventional heterodyne detection or a combination of heterodyne and Lloyd's mirror detection.
公开/授权文献
- US6117518A Particulate reinforcement for honeycomb core materials 公开/授权日:2000-09-12
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