发明授权
- 专利标题: Noncontact tracing control device
- 专利标题(中): 非接触式追踪控制装置
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申请号: US842345申请日: 1992-03-25
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公开(公告)号: US5345687A公开(公告)日: 1994-09-13
- 发明人: Hitoshi Matsuura , Eiji Matsumoto
- 申请人: Hitoshi Matsuura , Eiji Matsumoto
- 申请人地址: JPX Yamanashi
- 专利权人: Fanuc, Ltd.
- 当前专利权人: Fanuc, Ltd.
- 当前专利权人地址: JPX Yamanashi
- 优先权: JPX2-196797 19900725
- 主分类号: G01B11/24
- IPC分类号: G01B11/24 ; B23Q35/127 ; B23Q35/128 ; B23Q35/38 ; G01B11/245
摘要:
In a copy control device wherein a model (6) and a workpiece moved relatively with a tracer head (4) and a tool in an X-Y plane, measured distance values to the surface of the model, which are detected by first and second non-contact detectors (5a, 5b) obliquely mounted on the tracer head (4) rotatable about a Z axis are periodically sampled to obtain the coordinate values of measured points on the surface of the model, a normal vector (Nn) on the surface of the model is calculated from three coordinate values out of four measured points (P1n-1, P1n, P2n-1, P2n) successively obtained by the both detectors, and the tracer head is rotated so as to move along a projection (N1n) of the normal vector (Nn) on the X-Y plane, so that measuring axes of the detectors are controlled to be approximately vertical to the surface of the model. After two points are selected from four measured points, such a point is selected out of the remaining two measuring two points as a third point that satisfies a condition that a point of intersection between a perpendicular from such a point to a straight line passing through the previously selected two points and the above-mentioned straight line is interposed between the previously selected two points, and that satisfies a condition that the length of the above mentioned perpendicular is larger than a predetermined value.
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