发明授权
- 专利标题： Address sensitive memory testing
- 专利标题（中）： 处理敏感内存测试
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申请号： US33066申请日： 1993-03-10
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公开(公告)号： US5357521A公开(公告)日： 1994-10-18
- 发明人: Chingshun Cheng , Paul J. Roy
- 申请人： Chingshun Cheng , Paul J. Roy
- 申请人地址： NY Armonk
- 专利权人： International Business Machines Corporation
- 当前专利权人： International Business Machines Corporation
- 当前专利权人地址： NY Armonk
- 主分类号： G06F11/10
- IPC分类号： G06F11/10 ; G11C29/02 ; G11C29/10 ; G11C29/00
摘要：
A method for testing directly addressable memory in a computer system uses address sensitive test data. When a memory error occurs, or when an initial testing of the memory indicates an error, the affected locations are retested with selected address sensitive memory test patterns. Proper address sensitive pattern selection allows all of the data bits, ECC data bits and address parity bits to be tested.
公开/授权文献
- USD366535S Chandelier 公开/授权日：1996-01-23
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