Invention Grant
- Patent Title: Virtual two gauge profile system
- Patent Title (中): 虚拟二量规简介系统
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Application No.: US102055Application Date: 1993-08-04
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Publication No.: US5388341APublication Date: 1995-02-14
- Inventor: Bipin Patel
- Applicant: Bipin Patel
- Applicant Address: MD Gaithersburg
- Assignee: Data Measurement Corporation
- Current Assignee: Data Measurement Corporation
- Current Assignee Address: MD Gaithersburg
- Main IPC: G01B21/08
- IPC: G01B21/08 ; B21B37/00 ; B21B38/02 ; G01B7/28 ; G01B7/34 ; G01B5/06 ; G01B7/06
Abstract:
A method and system for measuring a profile of a strip of material produced in a reversing mill in which a direction of travel of the strip is reversible includes a single thickness gauge that measures the thickness of the strip and generates the thickness signals, and a moving device coupled to the gauge. The moving device controllably moves the gauge transversely to the strip so that the gauge measures the thickness of the strip and different points across a width of the strip in one pass of the strip through the gauge. The moving device maintains the gauge in a stationary position in another pass of the strip through the gauge such that the gauge measures the thickness of the strip and different points along the longitudinal lines of the strip. The measurements of the thickness of the strip at the different points are interpreted into profile data. This profile data can be either displayed or used by a mill computer to control the processing of the strip.
Public/Granted literature
- US6068754A Multi-tank gel developing apparatus and method Public/Granted day:2000-05-30
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