发明授权
US5392115A Method of detecting inclination of a specimen and a projection exposure device as well as method of detecting period of periodically varying signal 失效
检测试样和投影曝光装置的倾斜度的方法以及检测周期性变化信号周期的方法

  • 专利标题: Method of detecting inclination of a specimen and a projection exposure device as well as method of detecting period of periodically varying signal
  • 专利标题(中): 检测试样和投影曝光装置的倾斜度的方法以及检测周期性变化信号周期的方法
  • 申请号: US936661
    申请日: 1992-08-28
  • 公开(公告)号: US5392115A
    公开(公告)日: 1995-02-21
  • 发明人: Yoshitada OshidaTaku NinomiyaToshiei Kurosaki
  • 申请人: Yoshitada OshidaTaku NinomiyaToshiei Kurosaki
  • 申请人地址: JPX Tokyo
  • 专利权人: Hitachi, Ltd.
  • 当前专利权人: Hitachi, Ltd.
  • 当前专利权人地址: JPX Tokyo
  • 优先权: JPX3-218259 19910829
  • 主分类号: G03F9/00
  • IPC分类号: G03F9/00 G01B9/02
Method of detecting inclination of a specimen and a projection exposure
device as well as method of detecting period of periodically varying
signal
摘要:
A method for detecting a period of a periodically varying signal and/or an inclination of a specimen utilizing an exposure apparatus wherein a coherent light is divided into first and second lights and the first light is irradiated onto the specimen at a predetermined angle, and a reflected light thereof and a reference light as the second light interfere with each other so as to form interference fringes, the interference fringes are detected, and the inclination of the specimen is detected from a pitch representing a period of the interference fringes. The method includes detecting a spectrum of a signal intensity obtained from the detected interference fringes or the periodically varying signal, subjecting the detected spectrum data to a fast complex Fourier transformation, calculating a true spectrum peak position j.sub.R in accordance with a relationship j.sub.R =j.sub.0 +.DELTA., where j.sub.0 is a detected spectrum peak position and .DELTA. is a correcting value estimated from the Fourier transformed spectrum data adjacent to j.sub.0, and calculating the pitch P of the period of the signal intensity information in accordance with a relationship P=N/j.sub.R, where N is the number of sample data points for the complex Fourier transformation. Further, the method includes calculating the inclination of the specimen from the pitch P.
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