发明授权
- 专利标题: Process for detecting voids in ceramic bodies
- 专利标题(中): 检测陶瓷体空隙的方法
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申请号: US852644申请日: 1992-03-17
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公开(公告)号: US5395641A公开(公告)日: 1995-03-07
- 发明人: Kazuyoshi Shibata , Toshihiko Suzuki
- 申请人: Kazuyoshi Shibata , Toshihiko Suzuki
- 申请人地址: JPX
- 专利权人: NGK Insulators, Ltd.
- 当前专利权人: NGK Insulators, Ltd.
- 当前专利权人地址: JPX
- 优先权: JPX3-080631 19910320; JPX4-035031 19920221
- 主分类号: G01N27/20
- IPC分类号: G01N27/20 ; G01N33/38 ; B05D1/00
摘要:
A process for detecting any defect in a ceramic body, including the steps of forming an electrically conductive layer in any such defects including fine voids present in the ceramic body, and then detecting presence or absence of the defect by measuring electrical conductivity between two given points shorted by the electrically conductive layer. The electrically conductive layer may be formed by penetrating an electrically conductive liquid into the defect. Alternatively, the electrically conductive layer may be formed by penetrating a penetrable liquid capable of forming the electrically conductive layer by thermal treatment or chemical treatment and thermally or chemically treating same.
公开/授权文献
- US5843092A Balloon catheter and stent delivery device 公开/授权日:1998-12-01
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