发明授权
- 专利标题： Test frame
- 专利标题（中）： 测试框架
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申请号： US27709申请日： 1993-03-05
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公开(公告)号： US5413306A公开(公告)日： 1995-05-09
- 发明人: Richard J. Mahoney, III , Paulo A. Martin , Graham E. Mead , David W. Scanlon
- 申请人： Richard J. Mahoney, III , Paulo A. Martin , Graham E. Mead , David W. Scanlon
- 申请人地址： MA Canton
- 专利权人： Instron Corporation
- 当前专利权人： Instron Corporation
- 当前专利权人地址： MA Canton
- 主分类号： G01N3/04
- IPC分类号： G01N3/04 ; G01N3/08 ; F16M11/00 ; G01N3/02
摘要：
A testing machine frame is provided with facing extruded column covers extending between a base and a top housing, the columns continuous cross-sections providing a partially enclosed vertical zone with a vertical opening, the opening being closed above and below a crosshead with accordion blinds, and T-slots for carrying crosshead limit stops and accessories.
公开/授权文献
- US6020394A Crosslinking of polymers 公开/授权日：2000-02-01
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