发明授权
- 专利标题: Light wavelength measuring apparatus with light modulation
- 专利标题(中): 光调制光波长测量装置
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申请号: US211717申请日: 1994-04-25
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公开(公告)号: US5432602A公开(公告)日: 1995-07-11
- 发明人: Manish Sharma , Hiroyuki Ibe
- 申请人: Manish Sharma , Hiroyuki Ibe
- 申请人地址: JPX Kawasaki
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JPX Kawasaki
- 优先权: JPX4-225819 19920825
- 主分类号: G01J3/12
- IPC分类号: G01J3/12 ; G01J9/00 ; G01J3/28
摘要:
A small-sized, inexpensive light wavelength measuring apparatus which has no mechanical movable sections but which is capable of high-speed measurement and high measurement precision to improve in reliability. In the light wavelength measuring apparatus, the intensity of incoming light is modulated by a light modulator in response to a reference signal supplied from a signal source and the modulation light is provided with a delay corresponding to the wavelength thereof through a group delay dispersion medium. The light is then converted into an electrical signal by a photoelectric converter, and a phase difference between the electrical signal and reference signal is obtained by a phase comparator, thereby measuring the wavelength of the incoming light.
公开/授权文献
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