发明授权
- 专利标题: Method and apparatus for determining a base line of a measurement
- 专利标题(中): 用于确定测量曲线的基线的方法和装置
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申请号: US28930申请日: 1993-03-08
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公开(公告)号: US5442574A公开(公告)日: 1995-08-15
- 发明人: Kazunari Shinya
- 申请人: Kazunari Shinya
- 申请人地址: JPX Kyoto
- 专利权人: Shimadzu Corporation
- 当前专利权人: Shimadzu Corporation
- 当前专利权人地址: JPX Kyoto
- 优先权: JPX4-97191 19920324
- 主分类号: G01D9/00
- IPC分类号: G01D9/00 ; G06F17/00 ; G01C3/00 ; G01F23/00
摘要:
A method and apparatus for determining a base line of a measurement curve wherein after preparing a template having an arc upward convex, a CPU of the data processing system moves, without rotating, the template with the arc of the template always contacting the measurement curve and determines the base line as the envelope of the arc of the template. During moving of the template, the system may move the template horizontally under the measurement curve; calculate, at every horizontal point at a given horizontal position of the template, the vertical distance between the arc of the template and the arc of the measurement curve; detect the minimum of the vertical distance at the given horizontal position of the template; and move the template vertically at the given horizontal position by the minimum vertical distance. To determine the base line, the CPU initializes data of the base line by the smallest value and judges whether the arc of the template after moved is superior to the arc before moved at every point of the arc after moved. The data of the base line is updated at the points where the arc after moved is superior to the are before moved by the data of the arc after moved.
公开/授权文献
- USD362326S Waste container dolly 公开/授权日:1995-09-12
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