发明授权
- 专利标题: Optometric apparatus
- 专利标题(中): 验光仪
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申请号: US18033申请日: 1993-02-16
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公开(公告)号: US5444504A公开(公告)日: 1995-08-22
- 发明人: Toshiro Kobayashi , Kazuhiro Yoshimura , Akihiro Hayashi , Yoshinobu Hosoi , Nobuyuki Yano
- 申请人: Toshiro Kobayashi , Kazuhiro Yoshimura , Akihiro Hayashi , Yoshinobu Hosoi , Nobuyuki Yano
- 申请人地址: JPX
- 专利权人: Nidek Co., Ltd.
- 当前专利权人: Nidek Co., Ltd.
- 当前专利权人地址: JPX
- 优先权: JPX4-072313 19920221; JPX4-287002 19920930
- 主分类号: A61B3/028
- IPC分类号: A61B3/028 ; A61B3/18 ; A61B3/02
摘要:
An optometric apparatus includes an operating table and a vision test chart displaying device provided internally within the operating table. An optical group, including a plurality of reflection-type optical elements, are disposed within the operating table. The optical group repeatedly reflects an optical image of the vision test chart projected from the vision test chart displaying device along an optical path within said operating table. A first deflecting optical element reflects the optical image of the vision test chart reflected by the reflection-type optical element group outside the operating table in a first direction. A second deflecting optical element then reflects the optical image of the vision test chart reflected by the first deflecting optical element in a second direction toward the examinee's eyes. A line of vision of the examinee in looking at the optical image reflected by the second deflecting optical element obliquely intersects a plane passing through the optical path defined by the optical group.
公开/授权文献
- US5931301A Carpet sample display 公开/授权日:1999-08-03