发明授权
- 专利标题: Integrated circuit power device with external disabling of defective devices and method of fabricating same
- 专利标题(中): 具有外部禁止故障装置的集成电路功率器件及其制造方法
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申请号: US895339申请日: 1992-06-08
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公开(公告)号: US5446310A公开(公告)日: 1995-08-29
- 发明人: Bantval J. Baliga , Prasad Venkatraman
- 申请人: Bantval J. Baliga , Prasad Venkatraman
- 申请人地址: NC Raleigh
- 专利权人: North Carolina State University
- 当前专利权人: North Carolina State University
- 当前专利权人地址: NC Raleigh
- 主分类号: H01L21/66
- IPC分类号: H01L21/66 ; H01L23/525 ; H01L23/48
摘要:
An integrated circuit power device includes many cell blocks which are electrically connected in parallel, with each of the cell blocks including at least one cell such as MOSFET, electrically connected in parallel. External measurement access means such as test pads are electrically connected to each cell block, so that the cell blocks can be externally measured and a defective cell block can be identified. Externally activated disabling means such as fusible links are also provided, so that the fusible links connected to defective cell blocks can be opened. An operable integrated circuit power device is thereby obtained, notwithstanding a defective cell block. The fusible links are incapable of automatic activation in response to the defect in the cell block, but are externally opened upon detection of a defective cell block. By decoupling the defect measurement and cell disabling functions, low levels of leakage current may be specified for the power device. The fusible links are preferably formed using the same mask and material as the gate electrode, so that extra fabrication steps are not needed.
公开/授权文献
- US5737949A Automobile anti-theft device 公开/授权日:1998-04-14
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