An electro-optical measurement device for the sampling of an electric signal (SI) in an electronic component by means of a radiation beam. Special embodiments of the electro-optic measurement device are described. An electro-optic sensor element is provided with an electrically conductive tip at one side and with an electrode at the other side, so that an absolute and calibrated measurement is possible. The measurement beam can be high-frequency pulsed with a pulse (Lp) per period of the test signal (SI). The pulse series is low-frequency modulated and the pulses exhibit, relative to the test signal, a constant phase relationship during the first half periods of the modulation signal and a varying phase relationship during the second half periods so that accurate and reliable measurement is possible.