发明授权
- 专利标题: Automated process planning for quality control inspection
- 专利标题(中): 自动化过程规划进行质量检验
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申请号: US179596申请日: 1993-12-30
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公开(公告)号: US5465221A公开(公告)日: 1995-11-07
- 发明人: Francis L. Merat , Kavous Roumina , Steven M. Ruegsegger , Robert B. Delvalle
- 申请人: Francis L. Merat , Kavous Roumina , Steven M. Ruegsegger , Robert B. Delvalle
- 申请人地址: DC Washington
- 专利权人: The United States of America as represented by the Secretary of the Air Force
- 当前专利权人: The United States of America as represented by the Secretary of the Air Force
- 当前专利权人地址: DC Washington
- 主分类号: G05B19/418
- IPC分类号: G05B19/418 ; G06F17/50
摘要:
A computer is used for generating a part inspection plan for a coordinate measuring machine (CMM), in a feature-based rapid design system (RDS), having a Feature-Based Design Environment (FBDE), an Episodal Associative Memory (EAM), Fabrication Planning (FAB), and an Inspection Plan (INSP), with features which include form features (D1) which define the form or shape of the part, manufacturing features (D2), inspection features (D3), and geometric and design (GD&T) features (D4). The Inspection Plan (INSP) includes interaction means wherein the inspector interacts with the system to guide it to a desired result, and the inspector can define setups, measurement points, sequence for the points, and the via points. For the inspector's sequence input, a learning process is included, so that the inspector's desired sequence is sent to discovery means for organizing patterns and defining rules, which by recalling relevant past experiences, and learning from the inspector's input, creates a "self-improving" expert system.
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