A simulated load circuit for measuring the impedance of the arc discharge of an electrodeless discharge lamp of the type having an arc tube and an excitation coil for exciting the arc discharge in an ionizable fill contained therein includes: a secondary coil spaced apart from the excitation coil by a distance which is varied in order to vary the coupling coefficient between the secondary coil and the excitation coil; a fixed load resistance coupled to the secondary coil; and a variable matching network coupled in series or parallel with the load resistance, the impedance of the matching network being varied in order to vary the ratio of reactance to resistance of the load circuit. The distance between the secondary coil and the excitation coil is varied, and the impedance of the matching network is varied, until the input impedance of the load circuit is substantially equivalent to the operating impedance of the lamp. The simulated load circuit is useful for designing and testing ballast circuits for electrodeless discharge lamps and for providing measurements of arc discharge power and excitation coil efficiency.