发明授权
- 专利标题: Positional deviation detecting method
- 专利标题(中): 位置偏差检测方法
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申请号: US242066申请日: 1994-05-13
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公开(公告)号: US5481363A公开(公告)日: 1996-01-02
- 发明人: Masakazu Matsugu , Kenji Saitoh , Jun Hattori , Sakae Houryu
- 申请人: Masakazu Matsugu , Kenji Saitoh , Jun Hattori , Sakae Houryu
- 申请人地址: JPX Tokyo
- 专利权人: Canon Kabushiki Kaisha
- 当前专利权人: Canon Kabushiki Kaisha
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX2-115445 19900501; JPX2-272926 19901011; JPX2-272927 19901011; JPX2-272928 19901011; JPX2-272929 19901011
- 主分类号: G03F9/00
- IPC分类号: G03F9/00 ; G01B11/00
摘要:
A method of detecting a relative positional deviation of a first object having a first grating mark with an optical power and a second object having a second grating mark with an optical power, is disclosed, wherein a projected radiation beam is diffracted by the first and second grating marks in sequence and, on the basis of a position of convergence on a light receiving surface of plural diffraction beams produced by the diffraction through the first and second grating marks and including a signal beam having been diffracted at a predetermined order by each of the first and second grating marks, the relative positional deviation is determined, a detection zone is defined on the light receiving surface, the signal beam is converged upon the detection zone, and a predetermined diffraction beam of the plural diffraction beams which, for a relative positional deviation of the first and second objects, shows displacement different from that of the signal beam is substantially prevented from being converged upon the detection zone.
公开/授权文献
- USD319390S Bottle 公开/授权日:1991-08-27
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