发明授权
- 专利标题: Defect detecting apparatus and method
- 专利标题(中): 缺陷检测装置及方法
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申请号: US362942申请日: 1994-12-23
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公开(公告)号: US5498874A公开(公告)日: 1996-03-12
- 发明人: Motosuke Miyoshi , Katsuya Okumura
- 申请人: Motosuke Miyoshi , Katsuya Okumura
- 申请人地址: JPX Kawasaki
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JPX Kawasaki
- 优先权: JPX5-328078 19931224
- 主分类号: G01N23/225
- IPC分类号: G01N23/225 ; G01R31/302 ; G21K5/04 ; H01J37/04 ; H01L21/66
摘要:
The fault detecting apparatus comprises an electro optical lens-barrel having a rectangular cathode (101), three four-pole lenses (117, 119, 121), and a deflector (129). The four-pole lenses are controlled to form such a rectangular beam that a ratio of a reduction ratio at the sample surface of an electron beam locus along a longitudinal direction of the rectangular cathode to a reduction ratio at the sample surface of an electron beam locus along a lateral direction of the rectangular cathode becomes equal to a ratio of a length to a width of the rectangular cathode and in addition a width of the beam is equal to a required minimum fault detection width. Further, the deflector (129) is controlled by a deflection controller (130) in such a way that the rectangular beam can be scanned (raster scanning) by moving the rectangular beam at every scanning stroke corresponding to the minimum fault detection width in both the longitudinal and lateral directions of the rectangular beam.
公开/授权文献
- US5113274A Matrix-type color liquid crystal display device 公开/授权日:1992-05-12