发明授权
US5534807A Sampling circuit, phase reference detecting circuit and sampling clock
shifting circuit
失效
采样电路,相位参考检测电路和采样时钟移位电路
- 专利标题: Sampling circuit, phase reference detecting circuit and sampling clock shifting circuit
- 专利标题(中): 采样电路,相位参考检测电路和采样时钟移位电路
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申请号: US407652申请日: 1995-03-21
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公开(公告)号: US5534807A公开(公告)日: 1996-07-09
- 发明人: Yoshihiro Inada , Shinji Yamashita , Miki Nishimoto
- 申请人: Yoshihiro Inada , Shinji Yamashita , Miki Nishimoto
- 申请人地址: JPX Itami JPX Tokyo
- 专利权人: Mitsubishi Electric Semiconductor Software Corporation,Mitsubishi Denki Kabushiki Kaisha
- 当前专利权人: Mitsubishi Electric Semiconductor Software Corporation,Mitsubishi Denki Kabushiki Kaisha
- 当前专利权人地址: JPX Itami JPX Tokyo
- 优先权: JPX6-149747 19940630
- 主分类号: H04N9/44
- IPC分类号: H04N9/44 ; H04N9/64 ; H03H11/16
摘要:
A sampling circuit is not susceptible to an influence of structural components and environmental changes. A phase difference detecting circuit (5) detects a deviation of a sampling clock (.phi.2) from optimal sampling timing and outputs a phase difference signal. On the other hand, a phase reference signal (ORG) which is used as a reference to determine a phase advance and a phase lag is generated by a phase reference detecting circuit (4). In accordance with these signals, a sampling clock shifting circuit (2) shifts the sampling clock (.phi.2) so that the sampling clock (.phi.2) is activated at optimal sampling timing. Sampling is performed in accordance with such a sampling clock (.phi.2), whereby a basic signal is generated from which the phase reference signal (ORG) and the phase difference signal (i.e., an equivalent signal (EQU) and a non-equivalent signal (UPDN)) are generated. By means of feedback control, the sampling clock is automatically activated at optimal sampling timing.
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