Invention Grant
US5547922A Fabrication of oxide superconductor devices and circuits by impurity ion
implantation
失效
通过杂质离子注入制造氧化物超导体器件和电路
- Patent Title: Fabrication of oxide superconductor devices and circuits by impurity ion implantation
- Patent Title (中): 通过杂质离子注入制造氧化物超导体器件和电路
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Application No.: US390940Application Date: 1995-02-17
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Publication No.: US5547922APublication Date: 1996-08-20
- Inventor: Qi Y. Ma
- Applicant: Qi Y. Ma
- Applicant Address: CAX Vancouver
- Assignee: The University of British Columbia
- Current Assignee: The University of British Columbia
- Current Assignee Address: CAX Vancouver
- Main IPC: H01L39/24
- IPC: H01L39/24 ; C23C14/48
Abstract:
Superconductivity is inhibited in selected regions of a HTS material by subjecting the material to impurity ion bombardment at an energy level selected to implant ions in the material at a selected depth. The concentration of deposited ions varies with depth in the material according to a peaked depth distribution function which has a maximum at the selected depth. The material may be masked before implantation. After low temperature annealing, the material loses its superconducting characteristics in the selected regions but such characteristics are preserved at depths above and below the selected depth. The material's crystalline structure is preserved so additional layers can be epitaxially grown atop the inhibited material Multilayer HTS devices and circuits may be made by repeating the ion implantation and/or masking steps at with different ion energy levels.
Public/Granted literature
- US5047556A Photoinitiators having a combined structure Public/Granted day:1991-09-10
Information query
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