Invention Grant
- Patent Title: Optical detector for echelle spectrometer
- Patent Title (中): 光电探测器
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Application No.: US477169Application Date: 1995-06-07
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Publication No.: US5596407APublication Date: 1997-01-21
- Inventor: Andrew T. Zander , Charles B. Cooper, III , Ring-Ling Chien
- Applicant: Andrew T. Zander , Charles B. Cooper, III , Ring-Ling Chien
- Applicant Address: CA Palo Alto
- Assignee: Varian Associates, Inc
- Current Assignee: Varian Associates, Inc
- Current Assignee Address: CA Palo Alto
- Main IPC: G01J3/18
- IPC: G01J3/18 ; G01J3/28 ; G01J3/36
Abstract:
A solid-state detector for use in an atomic spectrometer comprises a plurality of arrays of sensing elements, or pixels, each of the arrays being positioned along and on the locations of spectral signals on a focal plane of an echelle grating spectrometer. The sensing elements are positioned along the many diffraction orders presented on a two-dimensional echelle grating focal plane so that at least one element is located at each and every resolution element regardless of global x-y coordinate positioning of the elements or with reference to each other. The result is a series of skewed lines of sensing elements, those lines being in the same shape as the series of diffraction order lines which comprise an echelle spectrum. The solid-state detector is particularly useful in an atomic spectrometer wherein an echelle grating is used to diffract incident radiation such that the various components of the radiation may be observed.
Public/Granted literature
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