发明授权
US5604347A Method and means for compensating for row variable offsets in a large
area solid state x-ray detector
失效
用于补偿大面积固态X射线检测器中的行可变偏移的方法和装置
- 专利标题： Method and means for compensating for row variable offsets in a large area solid state x-ray detector
- 专利标题（中）： 用于补偿大面积固态X射线检测器中的行可变偏移的方法和装置
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申请号： US501800申请日： 1995-07-13
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公开(公告)号： US5604347A公开(公告)日： 1997-02-18
- 发明人: Scott W. Petrick , Lawrence R. Skrenes , Jean C. Morvan , Paul R. Granfors
- 申请人： Scott W. Petrick , Lawrence R. Skrenes , Jean C. Morvan , Paul R. Granfors
- 申请人地址： WI Milwaukee
- 专利权人： General Electric Company
- 当前专利权人： General Electric Company
- 当前专利权人地址： WI Milwaukee
- 主分类号： G01T1/20
- IPC分类号： G01T1/20 ; A61B6/00 ; H04N5/32 ; H05G1/26 ; H05G1/64 ; H04N5/35
摘要：
Row variable offsets in a large area solid state x-ray detector are compensated for. Initially, a calibration is performed to determine the row variable offsets. The calibration is achieved by measuring the average offset of each row. During normal operation, this offset is compensated for in a converting circuit. The required signal range of the converting circuit is consequently reduced.
公开/授权文献
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