发明授权
US5642040A Electrooptic probe for measuring voltage of an object having a high
permittivity film fixed on an end face of a reflecting film fixed on an
electrooptic material
失效
用于测量固定在固定在电光材料上的反射膜的端面上的具有高电容率膜的物体的电压的电光探针
- 专利标题: Electrooptic probe for measuring voltage of an object having a high permittivity film fixed on an end face of a reflecting film fixed on an electrooptic material
- 专利标题(中): 用于测量固定在固定在电光材料上的反射膜的端面上的具有高电容率膜的物体的电压的电光探针
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申请号: US547449申请日: 1995-10-24
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公开(公告)号: US5642040A公开(公告)日: 1997-06-24
- 发明人: Hironori Takahashi , Kazuhiko Wakamori
- 申请人: Hironori Takahashi , Kazuhiko Wakamori
- 申请人地址: JPX Hamamatsu
- 专利权人: Hamamatsu Photonics K.K.
- 当前专利权人: Hamamatsu Photonics K.K.
- 当前专利权人地址: JPX Hamamatsu
- 优先权: JPX5-054221 19930315
- 主分类号: G01R1/067
- IPC分类号: G01R1/067 ; G01R1/07 ; G01R19/00 ; G01R23/16
摘要:
An electrooptic probe for measuring voltage of an object without contact with the object. The electrooptic probe according to the present invention includes an electro-optic material having a refractive index to light that varies in accordance with an electric field, a conductive reflecting film for reflecting an incident beam transmitted through the electro-optic material, fixed to an end face of the electro-optic material facing the object to be measured, a transparent electrode fixed on the other end face of the electro-optic material, and a high permittivity film fixed on an end face of the reflecting film facing the object to be measured.
公开/授权文献
- US5117445A Electronically enhanced X-ray detector apparatus 公开/授权日:1992-05-26
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