发明授权
- 专利标题： Scan testable double edge triggered scan cell
- 专利标题（中）： 扫描可测试的双边缘触发扫描单元
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申请号： US518421申请日： 1995-08-24
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公开(公告)号： US5646567A公开(公告)日： 1997-07-08
- 发明人: Stephen Felix
- 申请人： Stephen Felix
- 申请人地址： GBX Almondsbury
- 专利权人： SGS-Thomson Microelectronics Limited
- 当前专利权人： SGS-Thomson Microelectronics Limited
- 当前专利权人地址： GBX Almondsbury
- 优先权： GBX9417591 19940901
- 主分类号： G01R31/28
- IPC分类号： G01R31/28 ; G01R31/30 ; G01R31/3185 ; G06F11/22 ; H03K3/037 ; H03K3/289 ; H03K3/356
摘要：
A scan cell is described which can function as either a positive edge triggered latch or a double edge triggered latch during normal functional operation of circuitry to be scan tested. It functions only as a positive edge triggered latch when scan testing of a logic structure is to be performed.
公开/授权文献
- US5101666A Apparatus for detecting change of pressure in tubes 公开/授权日：1992-04-07