发明授权
US5666062A Voltage measuring using electro-optic material's change in refractive
index
失效
使用电光材料的折射率变化进行电压测量
- 专利标题： Voltage measuring using electro-optic material's change in refractive index
- 专利标题（中）： 使用电光材料的折射率变化进行电压测量
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申请号： US531542申请日： 1995-09-19
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公开(公告)号： US5666062A公开(公告)日： 1997-09-09
- 发明人: Hironori Takahashi , Kazuhiko Wakamori , Musubu Koishi , Akira Takeshima
- 申请人： Hironori Takahashi , Kazuhiko Wakamori , Musubu Koishi , Akira Takeshima
- 申请人地址： JPX Hamamatsu
- 专利权人： Hamamatsu Photonics K.K.
- 当前专利权人： Hamamatsu Photonics K.K.
- 当前专利权人地址： JPX Hamamatsu
- 优先权： JPX6-223618 19940919; JPX6-235162 19940929
- 主分类号： G01R15/24
- IPC分类号： G01R15/24 ; G01R31/308 ; G01R23/00 ; G01R23/16
摘要：
In this system, reflected light from an electro-optic probe is detected by a photodetector, and only a voltage signal of a frequency which is an integral multiple of the fundamental frequency of the output voltage from the photodetector is detected. The frequency characteristics of the output voltage from the photodetector can be measured at a high speed and a high accuracy.
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