发明授权
- 专利标题： Measurement system for chromium content in chromized layers and the like
- 专利标题（中）： 镀铬层中铬含量的测量系统等
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申请号： US758806申请日： 1996-12-03
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公开(公告)号： US5708692A公开(公告)日： 1998-01-13
- 发明人: Dennis Connolly , Walter R. Mohn , Bart A. Stuchell
- 申请人： Dennis Connolly , Walter R. Mohn , Bart A. Stuchell
- 申请人地址： LA New Orleans
- 专利权人： The Babcock & Wilcox Company
- 当前专利权人： The Babcock & Wilcox Company
- 当前专利权人地址： LA New Orleans
- 主分类号： G01N23/06
- IPC分类号： G01N23/06 ; G01N23/223
摘要：
A method and apparatus for measuring a target analyte diffused in a wall of a metal member provides a sample of the metal member which is cut to progressively reduce a wall thickness of the sample from zero at a first point on the sample to a selected depth at a second point on the sample. An x-ray analyzing system having an analyzing slot is moved past the sample between the first and second points. Data from the x-ray analyzing system during the translation of the sample is collected to analyze the analyte content.
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