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US5733042A Device and method for testing an optical element subjected to radiation 失效
用于测试经受辐射的光学元件的装置和方法

Device and method for testing an optical element subjected to radiation
摘要:
Device and method for testing an optical element (E) to determine ability to withstand heating by a high-energy luminous beam. The contact of a point (11) is applied to the optical element and is heated to a specific temperature to simulate radiation. The contact point includes a dog point having a sectional configuration similar to a track of a simulated radiation beam. The heat can be adjusted and the temperature sensed.
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