发明授权
US5733042A Device and method for testing an optical element subjected to radiation
失效
用于测试经受辐射的光学元件的装置和方法
- 专利标题: Device and method for testing an optical element subjected to radiation
- 专利标题(中): 用于测试经受辐射的光学元件的装置和方法
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申请号: US577384申请日: 1995-12-22
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公开(公告)号: US5733042A公开(公告)日: 1998-03-31
- 发明人: Erik Duloisy , Jean Dijon
- 申请人: Erik Duloisy , Jean Dijon
- 申请人地址: FRX Paris FRX Armees
- 专利权人: Commissariat a l'Energie Atomique,Etat Francais
- 当前专利权人: Commissariat a l'Energie Atomique,Etat Francais
- 当前专利权人地址: FRX Paris FRX Armees
- 优先权: FRX9415640 19941226
- 主分类号: G01N3/60
- IPC分类号: G01N3/60 ; G01N17/00 ; G01N25/00 ; G01N25/72
摘要:
Device and method for testing an optical element (E) to determine ability to withstand heating by a high-energy luminous beam. The contact of a point (11) is applied to the optical element and is heated to a specific temperature to simulate radiation. The contact point includes a dog point having a sectional configuration similar to a track of a simulated radiation beam. The heat can be adjusted and the temperature sensed.
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