发明授权
- 专利标题: Method and apparatus for preventing cracks in semiconductor die
- 专利标题(中): 用于防止半导体管芯中的裂纹的方法和装置
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申请号: US810494申请日: 1997-02-28
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公开(公告)号: US5846874A公开(公告)日: 1998-12-08
- 发明人: Marc Hartranft , Pat Zicolello
- 申请人: Marc Hartranft , Pat Zicolello
- 申请人地址: CA San Jose
- 专利权人: Cypress Semiconductor Corp.
- 当前专利权人: Cypress Semiconductor Corp.
- 当前专利权人地址: CA San Jose
- 主分类号: H01L23/00
- IPC分类号: H01L23/00 ; H01L23/58 ; H01L21/44
摘要:
An anchor structure placed in an open field in corner areas of the semiconductor die and along die edges for preventing cracks in the die. In the corner areas, the anchor structure is placed perpendicular to a resultant vector force, which is approximately at a 45.degree. angle to an imaginary horizontal line passing through the die. This perpendicular placement of the anchor structure more uniformly distributes the stresses along the anchor preventing corner cracks in the die. Along the die edges, the anchor structures are placed approximately perpendicular to the resultant vector forces that impinge the die edges.
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