发明授权
- 专利标题: Flaw detection apparatus
- 专利标题(中): 探伤仪
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申请号: US8211申请日: 1998-01-16
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公开(公告)号: US5850468A公开(公告)日: 1998-12-15
- 发明人: Haruhiko Yokoyama , Akira Kobayashi
- 申请人: Haruhiko Yokoyama , Akira Kobayashi
- 申请人地址: JPX Osaka-fu
- 专利权人: Matsushita Electric Industrial Co., Ltd.
- 当前专利权人: Matsushita Electric Industrial Co., Ltd.
- 当前专利权人地址: JPX Osaka-fu
- 主分类号: G06T7/00
- IPC分类号: G06T7/00 ; G06T7/60 ; G06K9/00
摘要:
A flaw detection apparatus detects a flaw formed on an object's surface based on a digital image data indicative of said object's surface as a group of plural pixels utilizing the image processing technique. An image processor is provided for detecting a direction in which each of group extends to combine a plurality of groups extending in substantially the same direction. The image processor further produces a flaw signal indicating sizes of thus combined groups.
公开/授权文献
- USD370892S Personal computer 公开/授权日:1996-06-18