发明授权
- 专利标题: Beryllium-copper bonding material
- 专利标题(中): 铍铜键合材料
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申请号: US601107申请日: 1996-02-16
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公开(公告)号: US5895533A公开(公告)日: 1999-04-20
- 发明人: Hiroshi Kawamura , Kiyotoshi Nishida , Naoki Sakamoto
- 申请人: Hiroshi Kawamura , Kiyotoshi Nishida , Naoki Sakamoto
- 申请人地址: JPX JPX
- 专利权人: Japan Atomic Energy Research Institute,NGK Insulators, Ltd.
- 当前专利权人: Japan Atomic Energy Research Institute,NGK Insulators, Ltd.
- 当前专利权人地址: JPX JPX
- 主分类号: B22F1/00
- IPC分类号: B22F1/00 ; B23K35/00 ; B23K35/30 ; C22C1/04 ; C21D1/18 ; C22F1/18
摘要:
For bonding pure beryllium to a copper alloy, a beryllium-copper material comprising a single layer or multiple layers having a thickness of 0.3-3.0 mm and containing at least 50 atomic % of Cu is inserted between the pure beryllium and the copper alloy to prevent bonding strength from degrading in the bonding process or during operation of a nuclear fusion reactor, by effectively mitigating formation of brittle intermetallic compounds and generation of thermal stress at the bonding interface.
公开/授权文献
- US4544834A Memory device 公开/授权日:1985-10-01
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