Invention Grant
- Patent Title: Static electrification assisted dielectrokinesis detection of plastics and other materials
- Patent Title (中): 静电充电辅助介质腐蚀检测塑料和其他材料
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Application No.: US846207Application Date: 1997-04-28
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Publication No.: US5907280APublication Date: 1999-05-25
- Inventor: Thomas Afilani
- Applicant: Thomas Afilani
- Applicant Address: DE Wilmington
- Assignee: DKL International, Inc.
- Current Assignee: DKL International, Inc.
- Current Assignee Address: DE Wilmington
- Main IPC: G01V3/08
- IPC: G01V3/08 ; G01N27/60 ; G08B23/00
Abstract:
A dielectrokinesis detector includes a chamber housing an exact dielectric replicate reference material that is subjected to external static electrification. The reference material is mechanically constrained, enabling the detection of the polarization energy dynamics of constrained dielectrophoretic force indicating the presence of any target with dielectric properties identical to the properties of the reference material. An antenna assembly increases the proximity distance (range) of detection. The static electrification source for the reference material increases the longevity of the detection ability to provide continuous detection capability, and an external electronic circuit source of electrical energy via an electrical current surge gives a quantifiable manifestation of the detection. In accordance with the principals of dielectrophoresis, the detector can detect the presence of a specific material irrespective of the presence or absence of any type of intervening, visual obstructing material structures, barriers or electromagnetic interference (EMI) signals.
Public/Granted literature
- US5241366A Thin film thickness monitor Public/Granted day:1993-08-31
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