发明授权
- 专利标题: Method of etching a substrate by means of chemical beams
- 专利标题(中): 通过化学束蚀刻基板的方法
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申请号: US694112申请日: 1996-08-08
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公开(公告)号: US5916822A公开(公告)日: 1999-06-29
- 发明人: Leon Goldstein , Jean-Louis Gentner , Philippe Jarry
- 申请人: Leon Goldstein , Jean-Louis Gentner , Philippe Jarry
- 申请人地址: FRX Paris
- 专利权人: Alcatel Optronics
- 当前专利权人: Alcatel Optronics
- 当前专利权人地址: FRX Paris
- 优先权: FRX9509728 19950810
- 主分类号: C30B23/08
- IPC分类号: C30B23/08 ; C23F4/00 ; C30B23/02 ; H01L21/203 ; H01L21/302 ; H01L21/18
摘要:
In order to facilitate resuming molecular beam epitaxy after etching a substrate or an epitaxial layer, the etching method is implemented in an ultra-high vacuum, and it consists in producing at least two simultaneous chemical beams converging towards the substrate or the layer, the beams being formed of substances, each of which is capable of reacting with elements of different types in the substrate or the layer so as to form volatile compounds. Application in particular to manufacturing photonic and optoelectronic components.
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