Invention Grant
- Patent Title: Infrared absorption measuring device
- Patent Title (中): 红外吸收测量装置
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Application No.: US915898Application Date: 1997-08-21
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Publication No.: US5923035APublication Date: 1999-07-13
- Inventor: Tobias Winkler , Horst-Dieter Hattendorff
- Applicant: Tobias Winkler , Horst-Dieter Hattendorff
- Applicant Address: DEX Lubeck
- Assignee: Dragerwerk AG
- Current Assignee: Dragerwerk AG
- Current Assignee Address: DEX Lubeck
- Priority: DEX19713928 19970404
- Main IPC: G01J3/10
- IPC: G01J3/10 ; G01J3/42 ; G01N21/3504 ; G01N21/35
Abstract:
A measuring device for determining the concentration of gases with two identical radiation sources and two radiation detectors, which delivers stable measured values despite the contamination that occurs or the shielding from radiation of the outer optical surfaces exposed to the gases or to mixtures of gases and despite possible mechanical disadjustments. The two radiation detectors are provided with an optical concentrator each for bundling the radiation, and being arranged in a gas-tight housing together with the two identical radiation sources and with a beam splitter. One radiation source is directed through a window that is transparent to infrared light to a plane mirror outside the gas-tight housing, and the beam path reflected by the plane mirror falls through the window that is transparent to infrared light onto the beam splitter. The beam splitter splits both the radiation of the first radiation source reflected by the plane mirror and that of the second radiation source between two radiation detectors. The first radiation detector is used as a measuring detector and the second radiation detector is used as a reference detector.
Public/Granted literature
- US5300814A Semiconductor device having a semiconductor substrate with reduced step between memory cells Public/Granted day:1994-04-05
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