发明授权
- 专利标题: Method and apparatus for measuring critical current value of superconducting wire
- 专利标题(中): 测量超导线临界电流值的方法和装置
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申请号: US28929申请日: 1998-02-24
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公开(公告)号: US5936394A公开(公告)日: 1999-08-10
- 发明人: Tetsuyuki Kaneko , Tetsuaki Sashida
- 申请人: Tetsuyuki Kaneko , Tetsuaki Sashida
- 申请人地址: JPX Osaka
- 专利权人: Sumitomo Electric Industries, Ltd.
- 当前专利权人: Sumitomo Electric Industries, Ltd.
- 当前专利权人地址: JPX Osaka
- 优先权: JPX9-040887 19970225
- 主分类号: G01N27/00
- IPC分类号: G01N27/00 ; G01R31/00 ; G01R33/12 ; G01R19/00
摘要:
Method and apparatus of measuring a critical current value of a superconducting wire formed by wire sections S(n), n being 1.ltoreq.n.ltoreq.N and initially set to 1, comprising a first step (a) of determining electric currents I(m), m being 1.ltoreq.m.ltoreq.M; a second step (b) of setting m to 1; a third step (c) of passing the electric current I(m) through the wire section S(n); a fourth step (d) of detecting a voltage generated in the wire section S(n) by the electric current I(m); a fifth step (e) of replacing m with m+1; a sixth step (f) of repeating the steps (c) to (e) until m is equal to M; a seventh step (g) of replacing n with n+1; an eighth step (h) of repeating the steps (b)-(g) until n is equal to N, thereby obtaining N.times.M voltages; a ninth step (i) of setting m to 1; a tenth step (j) of summing up the N voltages generated by the same electric current I(m) to obtain a summation voltage represented by Vsum(m); an eleventh step (k) of replacing m with m+1 after the step (j); a twelfth step (l) of repeating the steps (j) and (k) until m is equal to M, thereby obtaining M summation voltages Vsum(m); and a thirteenth step (m) of calculating the critical current value of the superconducting wire on the basis of a reference voltage and a relationship between the summation voltages Vsum(m) and the electric currents I(m), the reference voltage being predetermined depending upon the superconducting wire length.
公开/授权文献
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