发明授权
- 专利标题: High-reflection attenuating light interception apparatus
- 专利标题(中): 高反射衰减光截取装置
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申请号: US915954申请日: 1997-08-21
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公开(公告)号: US5937122A公开(公告)日: 1999-08-10
- 发明人: Kazuhiro Ohki , Yoshinori Satoh , Nobuaki Ema
- 申请人: Kazuhiro Ohki , Yoshinori Satoh , Nobuaki Ema
- 申请人地址: JPX Tokyo
- 专利权人: Ando Electric Co., Ltd.
- 当前专利权人: Ando Electric Co., Ltd.
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX8-225667 19960827
- 主分类号: G02B6/38
- IPC分类号: G02B6/38 ; G02B6/42 ; G02B6/36
摘要:
A high-reflection attenuation light-interception apparatus having a measured optical plug (1) which is PC polished on its output terminal, a short ferrule (2) which has an internal graded index fiber (6) with a PC polished input terminal and diagonal polished output terminal, a receptacle (3) which directly connects the output terminal of the measured optical plug (1) and the input terminal of the short ferrule (2), a light-interception element which receives light propagated through the graded index fiber (6) in the short ferrule (2), and a light-interception element block which fixes in face to face relationship the output terminal of the short ferrule (2) and the receiving surface of the light-interception element (4).
公开/授权文献
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