发明授权
US5963470A Static semiconductor memory cell with improved data retention stability 失效
具有改进的数据保持稳定性的静态半导体存储单元

Static semiconductor memory cell with improved data retention stability
摘要:
In a SRAM cell including a bipolar transistor and a cut transistor, the threshold Vtheff (Driver) of driver transistor and the threshold Vtheff (Cut) of cut transistor are set such that they satisfy the expressions,Vtheff(Driver).gtoreq.�{log(1 .mu.A)}-{log(Vcc/10R)}!.times.S(1)�{log(1 .mu.A)}-{log((Ie.times.(1/(hFE+1)))/10)}!.times.S.ltoreq.Vtheff(Cut).ltoreq.�{log(1 .mu.A)}-{log(Vcc/R)}!.times.S(2)Vtheff(Cut)-S.ltoreq.Vtheff(Ac) (3)
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