发明授权
- 专利标题: Potential measuring apparatus and potential measuring method
- 专利标题(中): 潜在的测量仪器和电位测量方法
-
申请号: US218628申请日: 1998-12-22
-
公开(公告)号: US5983043A公开(公告)日: 1999-11-09
- 发明人: Hironori Ohwaki , Koji Yamazaki , Toshiyuki Ehara , Masaya Kawada , Takaaki Kaya , Tetsuya Karaki
- 申请人: Hironori Ohwaki , Koji Yamazaki , Toshiyuki Ehara , Masaya Kawada , Takaaki Kaya , Tetsuya Karaki
- 申请人地址: JPX Tokyo
- 专利权人: Canon Kabushiki Kaisha
- 当前专利权人: Canon Kabushiki Kaisha
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX9-355009 19971224; JPX9-355476 19971224
- 主分类号: G01R29/12
- IPC分类号: G01R29/12 ; G03G15/00 ; G03G21/00
摘要:
In a surface potential measuring apparatus for measuring a potential configuration by moving a photosensitive body of an image forming apparatus of electrophotographic type and at least one potential sensor relative to each other and by generating dielectric current in the potential sensor due to change in potential on a surface of the photosensitive body and by analyzing the dielectric current, a width of a detecting portion of the potential sensor is smaller than a width of the change in potential to be measured, and a sectional shape of the detecting portion in a plane perpendicular to the surface of the photosensitive body and parallel to the relative movement direction does not include any edge.
公开/授权文献
信息查询