Invention Grant
- Patent Title: Theft checking system
- Patent Title (中): 盗窃检查系统
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Application No.: US817849Application Date: 1997-04-25
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Publication No.: US5995005APublication Date: 1999-11-30
- Inventor: Michinari Hayashi
- Applicant: Michinari Hayashi
- Applicant Address: JPX Aichi
- Assignee: Maspro Denkoh Company, Ltd.
- Current Assignee: Maspro Denkoh Company, Ltd.
- Current Assignee Address: JPX Aichi
- Priority: JPX7-220861 19950829
- Main IPC: G01S13/74
- IPC: G01S13/74 ; G08B13/24 ; G08B13/14
Abstract:
A theft checking system that improves detection precision of theft checking systems. A micrometer samples data of received signals for three periods of a swept signal. A signal analyzer confirms signals that are regarded as resonance signals occurring in each of the first half and the second half of the first period, ignoring noise signals, and determines only whether similar signals corresponding to the resonance signals are present in each of the following two periods. A detection circuit recognizes the presence of the resonance signals and thereby recognizes and notifies passage of a tagged article.
Public/Granted literature
- USD343302S Chair Public/Granted day:1994-01-18
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